Guia docent 2007_08 Escola Tècnica Superior d`Enginyeria Química

Objectius d'aprenentatge

Objectius	Competències
To provide a critical and systematic understanding, at the fore front of current knowledge, of the microscopic and spectroscopic techniques used to characterise nanostructures.
To know and to interpret the information that can be obtained from each characterisation technique, their performance and limitations.
Be able to judge if it is interesting to apply a given characterisation technique to solve a specific problem.
To learn how to use in practice AFM, SEM, TEM and the confocal microscope