| Educational guide School of Chemical Engineering |
english |
| Nanoscience and Nanotechnology (2010) |
 Subjects |
| INTRODUCTION TO CHARACTERIZATION TECHNIQUES |
| Contents |
| IDENTIFYING DATA | 2010_11 |
| Subject | INTRODUCTION TO CHARACTERIZATION TECHNIQUES | Code | 20635207 | |||||
| Study programme |
|
Cycle | 2nd | |||||
| Descriptors | Credits | Type | Year | Period | ||||
| 2.5 | Optional | Only annual |
||||||
| Competences | Learning aims | Contents |
| Planning | Methodologies | Personalized attention |
| Assessment | Sources of information | Recommendations |
| Topic | Sub-topic |
| 1. Introduction. Optical microscopy. Confocal microscopy. Applications and future perspectives. | |
| 2. Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND) | |
| 3. Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications. | |
| 4. Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local properties with AFM. Other scanning probe techniques. Applications to nanoscale materials. | |
| 5. Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Environmental Scanning Eletron Microscopy (ESEM). Transmission Electron Microscopy (TEM). Applications. | |
| 6. Electron Microscopy. Transmission Electron Microscopy (TEM). Applications. | |
| 7. Spectroscopy techiques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM. Applications to nanomaterials. |
