Educational guide School of Engineering |
english |
Electronic Engineering (2010) |
Subjects |
CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS |
IDENTIFYING DATA | 2011_12 | |||||||||||||||||
Subject (*) | CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS | Code | 17605221 | |||||||||||||||
Study programme |
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Cycle | 2nd | |||||||||||||||
Descriptors | Credits | Type | Year | Period | Exam timetables and dates | |||||||||||||
3 | Optional | Only annual |
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Modality and teaching language | ||||||||||||||||||
Prerequisites | ||||||||||||||||||
Department | Química Física i Inorgànica |
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Coordinator |
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magdalena.aguilo@urv.cat |
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Lecturers |
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Web | http://www.urv.net/perfils/7_alumnes_de_doctorat/marcos.htm | |||||||||||||||||
General description and relevant information | Descripció de la terminologia bàsica emprada en Cristal·lografia. xarxa real, reciproca, Grups espacials. Difracció de Raigs X, principals tècniques i aplicacions | |||||||||||||||||
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(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation. |