Educational guide Escola Tècnica Superior d`Enginyeria Química |
english |
Nanociència i Nanotecnologia (2006) |
Subjects |
EINES AVANÇADES DE MICROSCOPIA ELECTRÒNICA |
Sources of information |
IDENTIFYING DATA | 2007_08 |
Subject | EINES AVANÇADES DE MICROSCOPIA ELECTRÒNICA | Code | 205151211 | |||||
Study programme |
|
Cycle | 2nd | |||||
Descriptors | Credits | Type | Year | Period | ||||
2.5 | Optativa | Only annual |
Competences | Learning aims | Contents |
Planning | Methodologies | Personalized attention |
Assessment | Sources of information | Recommendations |
Basic |
Ray F. Egerton, Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM, Kluwer Academic-Plenum Publishers, 2005 N. Yao, Nan and Z. Wang, Zhong L., Handbook of Microscopy for Nanotechnology, Kluwer Academic-Plenum Publishers, 2005 M D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Plenum Press, 1996 J.I. Glodstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael, Scanning electron microscopy and X-Ray micronanalysis, 3rd ed., Kluwer Academic-Plenum Publishers, 2003 |
Complementary |
P. Goodhew, J. Humphreys, R. Beanland, Electron Microscopy and Analysis, 3 ed., Taylor & Francis, 2001 R.F. Egerton, Electron energy-loss spectroscopy in the electron microscope, 2 ed., Plenum Press, 1996 Fultz, Brent, Howe, James M., Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed., Springer, 2002 D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori and J.I. Glodstein, Advanced Scanning electron microscopy and X-Ray micronanalysis, 3rd ed., Kluwer Academic-Plenum Publishers, 2003 |