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Tipus A
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Codi |
Competències Específiques |
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Recerca |
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Tipus B
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Codi |
Competències Transversals |
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Recerca |
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Tipus C
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Codi |
Competències Nuclears |
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Recerca |
| Objectius |
Competències |
| To provide a critical and systematic understanding, at the fore front of current knowledge, of the microscopic and spectroscopic techniques used to characterise nanostructures. |
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| To know and to interpret the information that can be obtained from each characterisation technique, their performance and limitations. |
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| Be able to judge if it is interesting to apply a given characterisation technique to solve a specific problem. |
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| To learn how to use in practice AFM, SEM, TEM and the confocal microscope |
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| Tema |
Subtema |
| 1. |
Introduction. Microscopy and Spectroscopy techniques for characterising nanostructures. Resolution and type of information obtained: morphology, crystal structure, chemistry and electronic structure. |
| 2. |
Optical microscopy. Confocal microscopy. 4"pi" microscopy. Scanning Near Field Optical Microscopy. Applications and future perspectives. |
| 3. |
Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Scanning Tunneling Microscopy. Applications. |
| 4. |
Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Instrumentation and probes. Scanning probe techniques. |
| 5. |
Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications. |
| 6. |
Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local elastic properties with AFM. Other scanning probe techniques: Lateral Force Microscope, Magnetic Force Microscope, Electrostatic Force Microscope. Applications to nanoscale materials. |
| 7. |
Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND). Surface diffration techniques: High energy electron diffraction (RHEED) and Low-energy electron diffraction (LEED). |
| 8. |
Spectroscopy techniques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM, Electron energy loss spectroscopy. Applications to nanomaterials. |
| 9. |
Surface analysis and depth profiling. Electron spectroscopy of surfaces: X-Ray Photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Mass spectrometry of surfaces. Applications. |
| Metodologies :: Proves |
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Competències |
(*) Hores a classe |
Hores fora de classe |
(**) Hores totals |
| Activitats Introductòries |
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0 |
0 |
0 |
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| Sessió Magistral |
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0 |
0 |
0 |
| Pràctiques a través de TIC |
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0 |
0 |
0 |
| Treballs |
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0 |
0 |
0 |
| Seminaris |
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0 |
0 |
0 |
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| Atenció personalitzada |
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0 |
0 |
0 |
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(*) En el cas de docència no presencial, són les hores de treball amb suport vitual del professor.
(**) Les dades que apareixen a la taula de planificació són de caràcter orientatiu, considerant l’heterogeneïtat de l’alumnat |
Metodologies
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Descripció |
| Activitats Introductòries |
One introductory lecture providing a classification of the characterisation techniques and some applications in nanotechnology. |
| Sessió Magistral |
Lectures covering the basic principles, modes of operation, applications and fundamental limitations of the characterisation techniques. |
| Pràctiques a través de TIC |
Practical use of the confocal microscope, SEM, TEM and AFM. During these sessions we will pay attention to the basic hardware and software concepts. The aim of these sessions is to judge, from a practical point of view, the information obtained and to be aware of the limitations of the techniques. |
| Treballs |
Different samples will be provided so that the students can draw some conclusions of the nanostructures using the microscopes of the “Servei de Recursos Científics” of the Rovira i Virgili University. |
| Seminaris |
Each student will discuss two scientific papers from the recent “characterisation technique” literature (one about microscopy and the other about spectroscopy). |
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Descripció |
Pes |
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Altres comentaris i segona convocatòria |
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| Bàsica |
YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Kluver Academic Publishers, 2005
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Wiley, 2005
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, CRC Press, 2003
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Kluver Academic, Plenum Press, 2003
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| Complementària |
DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Kluver Academic Publishers, 2004
BHARAT, B., Springer Handbook of Nanotechnology, Springer, 2003
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science. Springer Handbook of Nanotechnology, Plenum Press, 1996
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Wiley, 1990
, Papers about recent trends in characterization techniques for nanostructures, ,
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