Tipus A
|
Codi |
Competències Específiques |
|
Recerca |
|
AR27 |
State-of-the-art,capabilities, limitations and applications of the current techniques used to characterise nanostructures. |
|
AR28 |
Identification of the characterisation techniques that can be used to solve a specific problem. |
|
AR29 |
Interpretation of the information obtained from the characterisation techniques. |
|
AR30 |
Capability to use SEM, TEM, AFM and Confocal Microscope from a practical point of view. |
Tipus B
|
Codi |
Competències Transversals |
|
Recerca |
|
BR2 |
Treballar de manera autònoma amb iniciativa. |
|
BR8 |
Capacity to learn. |
|
BR10 |
Critical abilities: analysis and syntesis. |
Tipus C
|
Codi |
Competències Nuclears |
|
Recerca |
|
CR1 |
Comunicar-se de manera efectiva en la pràctica professional i com a ciutadà. |
Objectius |
Competències |
State-of-the-art,capabilities, limitations and applications of the current techniques used to characterise nanostructures. |
AR27
|
BR2 BR8 BR10
|
CR1
|
Identification of the characterisation techniques that can be used to solve a specific problem.
|
AR28
|
BR2 BR8 BR10
|
CR1
|
Interpretation of the information obtained from the characterisation techniques. |
AR29
|
BR2 BR8 BR10
|
CR1
|
Capability to use SEM, TEM, AFM and Confocal Microscope from a practical point of view. |
AR30
|
BR2 BR8 BR10
|
CR1
|
Tema |
Subtema |
1. |
Introduction. Microscopy and Spectroscopy techniques for characterising nanostructures. Resolution and type of information obtained: morphology, crystal structure, chemistry and electronic structure. |
2. |
Optical microscopy. Confocal microscopy. 4"pi" microscopy. Scanning Near Field Optical Microscopy. Applications and future perspectives. |
3. |
Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Scanning Tunneling Microscopy. Applications. |
4. |
Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Instrumentation and probes. Scanning probe techniques. |
5. |
Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications. |
6. |
Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local elastic properties with AFM. Other scanning probe techniques: Lateral Force Microscope, Magnetic Force Microscope, Electrostatic Force Microscope. Applications to nanoscale materials. |
7. |
Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND). Surface diffration techniques: High energy electron diffraction (RHEED) and Low-energy electron diffraction (LEED). |
8. |
Spectroscopy techniques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM, Electron energy loss spectroscopy. Applications to nanomaterials. |
9. |
Surface analysis and depth profiling. Electron spectroscopy of surfaces: X-Ray Photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). Mass spectrometry of surfaces. Applications. |
Metodologies :: Proves |
|
Competències |
(*) Hores a classe |
Hores fora de classe |
(**) Hores totals |
Activitats Introductòries |
|
1 |
0 |
1 |
|
Sessió Magistral |
|
10 |
20 |
30 |
Treballs |
|
6 |
6 |
12 |
Resolució de problemes, exercicis a l'aula ordinària |
|
7 |
0 |
7 |
|
Atenció personalitzada |
|
10 |
0 |
10 |
|
Proves de Desenvolupament |
|
2 |
0 |
2 |
|
(*) En el cas de docència no presencial, són les hores de treball amb suport vitual del professor. (**) Les dades que apareixen a la taula de planificació són de caràcter orientatiu, considerant l’heterogeneïtat de l’alumnat |
Metodologies
|
Descripció |
Activitats Introductòries |
One introductory lecture providing a classification of the characterisation techniques and some applications in nanotechnology. |
Sessió Magistral |
Lectures covering the basic principles, modes of operation, applications and fundamental limitations of the characterisation techniques. |
Treballs |
Different samples will be provided so that the students can draw some conclusions of the nanostructures using the microscopes of the “Servei de Recursos Científics” of the Rovira i Virgili University. |
Resolució de problemes, exercicis a l'aula ordinària |
Formulació, anàlisi, resolució i debat de problemes o exercicis. L'alumne els ha treballat prèviament i la discussió és a classe.
|
|
Descripció |
Reunions amb els alumnes bé individualment o en petits grups per tal de resoldre dubtes, indicar punts de millora i orientar en el desenvolupament general de l'assignatura |
|
|
Descripció |
Pes |
Treballs |
Different samples will be provided so that the students can draw some conclusions of the nanostructures using the microscopes of the “Servei de Recursos Científics” of the Rovira i Virgili University. |
40 |
Resolució de problemes, exercicis a l'aula ordinària |
Formulació, anàlisi, resolució i debat de problemes o exercicis. L'alumne els ha treballat prèviament i la discussió és a classe.
|
20 |
Proves de Desenvolupament |
Proves en les que l’alumne ha de desenvolupar temes en les seves diverses vessants: teòriques i pràctiques. |
40 |
|
Altres comentaris i segona convocatòria |
|
Bàsica |
YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Kluver Academic Publishers, 2005
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Wiley, 2005
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, CRC Press, 2003
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Kluver Academic, Plenum Press, 2003
|
|
Complementària |
DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Kluver Academic Publishers, 2004
BHARAT, B., Springer Handbook of Nanotechnology, Springer, 2003
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science. Springer Handbook of Nanotechnology, Plenum Press, 1996
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Wiley, 1990
, Papers about recent trends in characterization techniques for nanostructures, ,
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