IDENTIFYING DATA

2010_11

Subject (*)

INTRODUCTION TO CHARACTERIZATION TECHNIQUES

Code

20635207

Study programme

Nanoscience and Nanotechnology (2010)

Cycle

2nd

Descriptors

Credits

Type

Year

Period

2.5

Optional

Only annual

Language

Anglès

Department

Química Analítica i Química Orgànica

Coordinator

RIU RUSELL, JORDI

E-mail

jordi.riu@urv.cat

Lecturers

RIU RUSELL, JORDI

Web

General description and relevant information

This course provides a critical and systematic understanding of the current techniques suited to the characterisation of the physical and chemical properties of nanostructures. This course covers the state-of-the-art of microscopy and spectroscopy, providing the basis to understand how best to use a particular technique and the situations in which it is best applied.

Competences

Type A	Code	Competences Specific
		Research
	AR27	State-of-the-art capabilities, limitations and applications of the current techniques used to characterise nanostructures.
	AR28	Identifying the characterization techniques that can be used to solve a specific problem.
	AR29	Interpretation of the information obtained from the characterization techniques.
	AR30	Using SEM, TEM, AFM and Confocal Microscopy from a practical point of view.
Type B	Code	Competences Transversal
		Research
	BR2	Treballar de manera autònoma amb iniciativa.
	BR8	Capacitat d'apendre
	BR10	Habilitats crítiques: anàlisi i sintesi.
Type C	Code	Competences Nuclear
		Common
	CC3	Communicating effectively as a professional and as a citizen

Learning aims

Objectives	Competences
State-of-the-art,capabilities, limitations and applications of the current techniques used to characterise nanostructures.	AR27	BR2 BR8 BR10	CC3
Identification of the characterisation techniques that can be used to solve a specific problem.	AR28	BR2 BR8 BR10	CC3
Interpretation of the information obtained from the characterisation techniques.	AR29	BR2 BR8 BR10	CC3
Capability to use SEM, TEM, AFM and Confocal Microscope from a practical point of view.	AR30	BR2 BR8 BR10	CC3

Contents

Topic	Sub-topic
1. Introduction. Optical microscopy. Confocal microscopy. Applications and future perspectives.
2. Diffraction techniques to determine crystal structures. Bulk diffraction techniques: X-Ray Diffraction (XRD) and Neutron Diffraction (ND)
3. Scanning probe microscopy (SPM) and spectroscopy. Principle of operation. Scanning Tunneling microscopy (STM). Basic principles. Surface structure determination by STM. Scanning Tunneling spectroscopies. STM-based atomic manipulations. Recent developments and applications.
4. Atomic Force Microscope (AFM). Basic principles. Contact, Non-contact and Tapping AFM modes. Measuring local properties with AFM. Other scanning probe techniques. Applications to nanoscale materials.
5. Electron microscopy. General aspects of electron optics. Electron beam generation. Electron beam interactions. Scanning Electron Microscopy (SEM). Environmental Scanning Eletron Microscopy (ESEM). Transmission Electron Microscopy (TEM). Applications.
6. Electron Microscopy. Transmission Electron Microscopy (TEM). Applications.
7. Spectroscopy techiques. Photon spectroscopy: Photoluminiscence, Infrared and Raman vibrational spectroscopy, X-Ray spectroscopy. Electron spectroscopy: Electron induced spectroscopies in SEM and TEM. Applications to nanomaterials.

Planning

Methodologies :: Tests

Competences

(*) Class hours

Hours outside the classroom

(**) Total hours

Introductory activities

Lecture

Laboratory practicals

Assignments

Personal tuition

Extended-answer tests

(*) On e-learning, hours of virtual attendance of the teacher.
(**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students.

Methodologies

Methodologies

	Description
Introductory activities	One introductory lecture providing a classification of the characterisation techniques and their role in the frame of nanoscience and nanotechnology.
Lecture	Lectures covering the basic principles, modes of operation, applications and fundamental limitations of the characterisation techniques.
Laboratory practicals	Practical sessions in the facilities of the "Servei de Recursos Científics" of the Rovira i Virgili University.
Assignments	Individual and group assignements.

Personalized attention

Personal tuition

Description

Meetings with students either individually or in small groups to answer questions, indicate areas of improvement and guide the overall development of the subject

Assessment

	Description	Weight
Assignments	Individual and group assignments.	40
Extended-answer tests	Final individual exam	40
Others	Individual participation during the classes and practical sessions	20

Other comments and second exam session

Sources of information

Basic	YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Kluver Academic Publishers, Last availabre edition KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Wiley, Last availabre edition BIRDI, K.S., Scanning probe microscopes: applications in science and technology, CRC Press, Last availabre edition GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Kluver Academic, Plenum Press, Last availabre edition Paolo Samori, Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Weinheim: Wiley-VCH, Last available edition,

Complementary	DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Kluver Academic Publishers, Last availabre edition BHUSHAN, B, Springer Handbook of Nanotechnology, Springer, Last availabre edition WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science. Springer Handbook of Nanotechnology, Plenum Press, Last availabre edition BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Wiley, Last availabre edition , Papers about recent trends in characterization techniques for nanostructures, ,

Recommendations

(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation.