Type A
|
Code |
Competences Specific | | A1.1 |
A1.1. Successfully studying and learning about the chosen research ambit: evaluating the technical and scientific importance, the technological potential and the viability of the nanoscience, design, preparation, properties, processes, developments, techniques and applications of materials. |
| A2.1 |
A2.1. Presenting results in line with the format of experimental scientific literature and in accordance with the commonly accepted standards. |
| A2.2 |
A2.2. Critically evaluating the results of research in the field of nanotechnology, materials and products and process design. |
Type B
|
Code |
Competences Transversal | | B3.1 |
B3.1. Collaborative teamwork, with responsibility shared among multidisciplinary, multilingual and multicultural teams. |
Type C
|
Code |
Competences Nuclear | | C1.1 |
Have an intermediate mastery of a foreign language, preferably English |
| C1.2 |
Be advanced users of the information and communication technologies |
Type A
|
Code |
Learning outcomes |
| A1.1 |
A1.1 Have a broad knowledge of the field of science and technology, and are aware of the capacities, limitations and applications of the current techniques used to characterise nanostructures.
| | A2.1 |
A2.1 Correctly interpret the information provided by characterisation techniques.
A2.1 Use SEM/ESEM, TEM, AFM and confocal microscopy from a practical point of view.
| | A2.2 |
A2.2 Can identify which technique or techniques need to be used to solve a particular problem of characterising nanostructures.
A2.2 Make practical use of ESEM/SEM, TEM, AFM and confocal microscopy.
|
Type B
|
Code |
Learning outcomes |
| B3.1 |
B3.1 Accept and comply with the rules of the group.
B3.1 Take active part in planning the team’s work, distributing tasks and respecting deadlines.
B3.1 Contribute to the positive management of any differences, disagreements and conflicts that arise in the team.
B3.1 Make their personal contribution in the time expected and with the resources available.
B3.1 Take active part and share information, knowledge and experiences.
B3.1 Take into account the points of view of others and give constructive feedback.
|
Type C
|
Code |
Learning outcomes |
| C1.1 |
Express opinions on abstract or cultural topics in a limited fashion.
Explain and justify briefly their opinions and projects.
Understand instructions about classes or tasks assigned by the teaching staff.
Understand routine information and articles.
Understand the general meaning of texts that have non-routine information in a familiar subject area.
Write letters or take notes about foreseeable, familiar matters.
| | C1.2 |
Understand basic computer hardware.
Understand the operating system as a hardware manager and the software as a working tool.
Use software for off-line communication: word processors, spreadsheets and digital presentations.
Use software for on-line communication: interactive tools (web, moodle, blogs, etc.), e-mail, forums, chat rooms, video conferences, collaborative work tools, etc.
|
Topic |
Sub-topic |
1. Introduction. Optical microscopy. Confocal microscopy. Aplications and future. |
|
2. Scanning probe microscopy (SPM). Background of the different techniques. Scanning tunnelling microscopy (STM). Basic principles. Determination of the surface by STM. Scanning and tunnelling spectroscopies. Atomic manipulation with STM. Recent advances and applications. |
|
3. Atomic force microscopy (AFM). Basic principles. Dynamic and contact modes. Measuring local properties with AFM. Other SPM techniques. Applications to materials in the nanoscale. |
|
4. Electron microscopy. General aspects. Generation of the beam of electrons. Interaction of electrons with matter. Scanning electron microscopy (SEM). Environmental scanning electron microscopy (ESEM). X-ray analysis in SEM/ESEM. Applications. |
|
5. Transmission electron microscopy (TEM). Sample preparation. Applications. |
|
6. Diffraction techniques for the determination of crystalline structures. X-ray diffraction (XRD). |
|
Methodologies :: Tests |
|
Competences |
(*) Class hours
|
Hours outside the classroom
|
(**) Total hours |
Introductory activities |
|
1.5 |
2.5 |
4 |
Lecture |
|
15 |
10 |
25 |
Laboratory practicals |
|
10 |
6 |
16 |
Assignments |
|
1 |
19 |
20 |
Presentations / oral communications |
|
1.5 |
6.5 |
8 |
Personal attention |
|
1 |
0 |
1 |
|
Extended-answer tests |
|
1 |
0 |
1 |
|
(*) On e-learning, hours of virtual attendance of the teacher. (**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students. |
Methodologies
|
Description |
Introductory activities |
An introductory session to provide a classification of the characterization techniques and their role in nanoscience and nanotechnology. Previously to the session, student will read a couple of papers about the framework of characterization techniques, and these papers will be discussed in class.. |
Lecture |
Sessions covering the basic principles, operation modes, applications and fundamental limitations of characterization techniques. |
Laboratory practicals |
Practical sessions in the facilities of "Servei de Recursos Científics" of Universitat Rovira i Virgili. |
Assignments |
Individual assignments and short presentations in class about a very specific subject that students have to work and present individually. |
Presentations / oral communications |
Students will form groups and each group will make an oral presentation about one of the course sessions. |
Personal attention |
Meetings with students, either individually or in groups, to improve their performance. |
Description |
Jordi Riu
Office 312, third floor Faculty of Chemistry
Phone: 977558491
e-mail: jordi.riu@urv.cat
|
Methodologies |
Competences
|
Description |
Weight |
|
|
|
|
Assignments |
|
Individual assignments |
25 |
Presentations / oral communications |
|
Group oral exposition |
25 |
Extended-answer tests |
|
Final individual written exam |
40 |
Others |
|
Active participation (questions, discussion in class, short presentations) during classes and practical sessions. |
10 |
|
Other comments and second exam session |
A minimum of 35% in each part is required to pass the subject. Attendance at lectures and practical sessions is mandatory. During the exams, any mobil telephone, tablet or other device that has not been expressly authorized for the exam must be switched off and out of view. Any attempt to pass any exam of any subject by fraudulent means (be this physical or electronic) will result in the student being awarded a fail for the exam in question. In the second term the student only has to do those parts not passed in the first term. The avaluation criteria are the same than in the first term. |
Basic |
YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Last available edition, Kluver Academic Publishers
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Last available edition, Wiley
|
|
Complementary |
DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Last available edition, Kluver Academic Publishers
BHUSHAN, B, Handbook of Nanotechnology, Last available edition, Springer
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science., Last available edition, Plenum Press
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Last available edition, Wiley
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, Last available edition, CRC Press
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Last available edition, Kluver Academic, Plenum Press
SAMORI, P., Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Last available edition, Weinheim: Wiley-VCH
|
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(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation. |
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