IDENTIFYING DATA 2011_12
Subject (*) CHARACTERIZATION OF CRYSTALS, NANOCRYSTALS AND NANOSTRUCTURED MATERIALS BY X-R DIFFRACTION METHODS Code 17605221
Study programme
Electronic Engineering (2010)
 Cycle 2nd
Descriptors Credits Type Year Period
3 Optional Only annual
Language
Català
Department Química Física i Inorgànica
Coordinator
AGUILÓ DÍAZ, MAGDALENA
 E-mail magdalena.aguilo@urv.cat
Lecturers
AGUILÓ DÍAZ, MAGDALENA
Web http://http://www.urv.net/perfils/7_alumnes_de_doctorat/marcos.htm
General description and relevant information Descripció de la terminologia bàsica emprada en Cristal·lografia. xarxa real, reciproca, Grups espacials. Difracció de Raigs X, principals tècniques i aplicacions

Competences
Type A Code Competences Specific
  Professional
  AP2 Dissenyar i desenvolupar experiments científics, així com analitzar i interpretar dades i resultats.
  Research
  AR1 Conèixer els processos de disseny, fabricació i verificació de sistemes microelectrònics en general i sistemes MEMS o amb sensors en particular.
Type B Code Competences Transversal
  Common
  BC2 Treballar autònomament amb iniciativa
Type C Code Competences Nuclear
  Common

Learning aims
Objectives Competences
Conèixer els fonaments de la difracció de Raigs per els cristall Conèixer les principals tècniques de difracció de Raigs X. Conèixer les principals aplicacions de les tècniques de difracció de Raigs X. Conèixer la relació entre l’estructura cristal.lina i la simetria espacial i puntual amb les propietats físiques dels materials. AR1
AP2
 BC2

Contents
Topic Sub-topic
1. Introduction to the crystallography. Basic concepts. 1-Introduction to the Crystallography. Symbols and terms. Vectors, coefficients and coordinates. Space groups of symmetry
2. X-ray diffraction methods. 2.1 The intensities of X-ray diffracted beams: the structure factor equation and its applications.

2.2 Some applications of X-ray powder (polycrystalline) diffraction techniques.
Identification of unknown phases.
Accurate lattice parameter measurements.
Crystalline structures refinement from X-ray powder diffraction.
2.3 X-ray diffraction with High Temperature camera.
Polimorfisme and phase transition with temperature.
X-ray dilatometry. Thermal tensor of the anisotropic materials.

2.4 Tridimensional X-ray diffraction. Euler goniometer with Schulz geometry. Textur goniometer.
Thin films characterization.
Orientation of crystalline materials for cutting.
Textur characterization of polycrystalline materials.
3. Relation between crystalline structure and morphology. 3.1Crystals, nanocrystals and nanostructured materials.
Nucleation and crystal growth.
Size and shape versus growth conditions.
Relation between crystalline structure and morphology.
3.2 Curie principle and Wulff theorem for the equilibrium form and crystal growth form.
Models and exemples.
4.-Anisotropy and physical properties of materials. 4.1 Anisotropy and physical properties of materials.
Physical Properties as Tensors.
Neumann’s Principle.
The value of a physical property in a given direction.
Curie’s principle.

Planning
Methodologies  ::  Tests
  Competences (*) Class hours Hours outside the classroom (**) Total hours
Introductory activities
1 0 1
 
Lecture
30 0 30
Problem solving, classroom exercises
35 0 35
 
Personal tuition
2 0 2
 
Practical tests
2 6 8
 
(*) On e-learning, hours of virtual attendance of the teacher.
(**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students.

Methodologies
Methodologies
  Description
Introductory activities Presentació de l’assignatura.
Lecture Exposició teòrica dels continguts de l’assignatura.
Problem solving, classroom exercises Realització d’un treball pràctic.

Personalized attention
 
Personal tuition
Description
Consulta de dubtes relacionats amb la matèria.

Assessment
  Description Weight
Problem solving, classroom exercises Resolució de problemes, exercicis a l'aula ordinària i lliurar un resum 80
Practical tests Realització d’un exercici pràctic i individual. 20
 
Other comments and second exam session

Sources of information

Basic
  • E. Hartmann. An introduction to Crystal Physics. Pu. International Union of Crystallography. Cardiff, 1984.
  • L.A. Shuvalov. Modern CrystallographyIV. Physical properties of crystals . Springer Verlag, 1988, pp.1-46
  • J.F. Nye. Physical properties of Crystals. Their representation by tensors and matrices. Oxford University Press, 1985, pp.3-48, pp.93-109.
  • B.D. Cullity. Elements of X-Ray Diffraction. Addison-Wesley Pu. Co., 1978.
  • R.A. Schwarzer. Texture and anisotropy of polycrystals. Trans. Tech. Pu., Germany, 1997.
  • A. Putnis. Introduction to the mineral Science. Cambridge University Press, 1992, pp.1-120.
  • R.A. Young.The Rietveld Method. Oxford University Press, 1995.
  • D.L.Bish and J.E.Post, Modern Powder Diffraction, Reviews in Mineralogy, V.20. Minera. Society of America. Washington, 1989.
  • Z.L Wang (edited by), Characterization of Nanophase materials, Wyley-VCH , Weinheim, 2000,pp.1-35; 315-350.
  • J.N. DiNardo. Nanoscale characterization of surfaces and interfaces. Wiley-VCH, Weinheim,1994.
  • P.J.Duke. Sincroton Radiation production and properties. Oxford University Press, 2000.
    • Complementary

     
    Recommendations
    (*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation.