|
Type A
|
Code |
Competences Specific |
|
Type B
|
Code |
Competences Transversal |
|
Type C
|
Code |
Competences Nuclear |
|
Type A
|
Code |
Learning outcomes |
|
Type B
|
Code |
Learning outcomes |
|
Type C
|
Code |
Learning outcomes |
| Topic |
Sub-topic |
| 0. Pasive components: Resistors, capacitors and inductors |
Resistors types and characteristics
Capacitors types and characteristics
Inductors characteristics |
| 1. Semiconductors |
Band Model/Bonds model
Free charge carriers (Generation-recombination)
Intrinsec and extrinsec semiconductors
Currents in a semiconductor: Drift and difussion
|
| 2. Diodes |
PN junction charge distribution, electric field and potential
V-I Characteristic. Diode polarization
Junction breakdown: Zener Diode
Circuital models (Losses resistor, parasitic capacitors)
Diode based circuits
|
| 3. BJT and MOS Transistors |
BJT working principles and types
Characteristic curves. Working regions
BJT Ebers-Möll Model
MOSFET working principles and types
Characteristic curves. Working regions
MOSFET equations
|
| 4. Switching transistors |
Introduction to logic gates
CMOS inverter
CMOS gates characterístics/limitations
Relevant parameters in sequential circuits |
| 5. Transistors as amplifiers |
Quiescent Point
Small signal equivalent circuit
Input/output impedances. Volatge and current gain
Dynamic Range
Multiple stage amplifiers
Frequencial response
|
| Methodologies :: Tests |
| |
Competences |
(*) Class hours
|
Hours outside the classroom
|
(**) Total hours |
| Introductory activities |
|
1 |
0 |
1 |
| Previous studies |
|
0 |
13 |
13 |
| Laboratory practicals |
|
13 |
4 |
17 |
| Lecture |
|
28 |
28 |
56 |
| Problem solving, classroom exercises |
|
10 |
20 |
30 |
| Personal tuition |
|
1 |
0 |
1 |
| |
| Practical tests |
|
1 |
0 |
1 |
| Objective multiple-choice tests |
|
4 |
0 |
4 |
| Extended-answer tests |
|
2 |
0 |
2 |
| |
(*) On e-learning, hours of virtual attendance of the teacher.
(**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students. |
Methodologies
| |
Description |
| Introductory activities |
Not available in English |
| Previous studies |
Not available in English |
| Laboratory practicals |
Not available in English |
| Lecture |
Not available in English |
| Problem solving, classroom exercises |
Not available in English |
| Personal tuition |
Not available in English |
|
Description |
|
Students will be able to solve any doubt about concepts reviewed in class or solving problems or in any other activity, attending to the office of any lecturer related to the matter, according to the timetable reserved for this purpouse. |
|
Methodologies |
Competences
|
Description |
Weight |
|
|
|
|
| Previous studies |
|
Students will prepare and perform a total of four Previous studies that should be delivered via Moodle. Statements with questions to answer can also be downloaded via Moodle. |
10 % |
| Laboratory practicals |
|
Students will assemble a set of circuits in the laboratory, checking their performance and realizing the requested measurements. The document with the necessary information can be downloaded via Moodle. Once the requested measurements are performed, students must prepare a report including these measurements and relevant comments, which must be submitted via Moodle. Both the correctness of measurements and comments, as the correction in language is to be assessed. |
10 % |
| Problem solving, classroom exercises |
|
Students will work in groups of 4 for a total of 3 problem collections. In the lecture room, each member of a given group will be asked to solve one or two problems within a collection. Then, one member of each group will be selected at random for his/her solution to be assessed and the mark obtained will be assigned to him/her and to any other group member. |
15 % |
| Extended-answer tests |
|
At the end of the semester a single test will assess the student's ability to apply the knowledge developed in the course for the analysis of basic electronic circuits.
A minimum score of 3.5 out of 10 is compulsory in this test to pass.
|
30 % |
| Practical tests |
|
Students will assemble and perform individually measurements on any of the circuits worked in the laboratory. |
15 % |
| Objective multiple-choice tests |
|
During the course, a total of 3 multiple choice tests will be performed individually by students in the lecture room on the concepts developed during lectures or worked by the student at home. |
20 % |
| Others |
|
|
|
| |
|
Other comments and second exam session |
|
COMMENTS: For multiple choice tests, students may not have or use any communication device or data transmission capacity. Students who fail to pass the continuous assessment will have a second round consisting in a three part exam: A Problem test to assess the ability to analyze theoretically different electronic circuits (45%) A multiple choice quiz about the basic concepts reviewed in the course (20%) A laboratory test to assess the ability to assemble a circuit and perform a set of measures (35%) (Students with a final score in the continuous assessment over 3.5 and a mark of 7 in the laboratory test may ask to keep this laboratory mark in this second round) |
| Basic |
A.R. Hambley, Electrónica, 2a Edició, 2001
Malik, Norbert R. , Circuitos electrónicos : análisis, diseño y simulación , , 1996
Cabré, R., Manual d'electrònica bàsica i tecnologia electrònica, , 2004
Bragós Bardia, Ramon;Chávez Domínguez, Juan Antonio;Fernández Chimeno, Mireya;Jiménez Serres, Vicent, Circuits i dispositius electrònics : fonaments d'electrònica, 2ª Edició, 2002
|
|
| Complementary |
|
|
| Subjects that continue the syllabus |
| ANALOGUE ELECTRONICS/17204109 | | DIGITAL ELECTRONICS/17204108 |
|
| Subjects that are recommended to be taken simultaneously |
| CIRCUIT THEORY II/17204106 |
|
| Subjects that it is recommended to have taken before |
| PHYSICS II/17204004 | | STATISTICS AND TRANSFORMED METHODS/17204009 | | CIRCUIT THEORY I/17204105 |
|
(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation. |
|