IDENTIFYING DATA 2016_17
Subject (*) INTRODUCTION TO CHARACTERIZATION TECHNIQUES Code 20705208
Study programme
Nanoscience, Materials and Processes: Chemical Technology at the Frontier
 Cycle 2nd
Descriptors Credits Type Year Period
3 Optional AN
Language
Anglès
Department Analytical Chemistry and Organic Chemistry
Coordinator
RIU RUSELL, JORDI
 E-mail jordi.riu@urv.cat
Lecturers
RIU RUSELL, JORDI
Web
General description and relevant information This subject aims to give a critical and systematic view of current suitable techniques for the characterization of physical and chemical properties of nanostructures. It covers the current state of the microscopic and related spectroscopic techniques, giving the backgrounds to better understand the best way to use a particular technique and the cases in which it should be applied.

Competences
Type A Code Competences Specific
 A1.1 A1.1. Successfully studying and learning about the chosen research ambit: evaluating the technical and scientific importance, the technological potential and the viability of the nanoscience, design, preparation, properties, processes, developments, techniques and applications of materials.
 A2.1 A2.1. Presenting results in line with the format of experimental scientific literature and in accordance with the commonly accepted standards.
 A2.2 A2.2. Critically evaluating the results of research in the field of nanotechnology, materials and products and process design.
Type B Code Competences Transversal
 B3.1 B3.1. Collaborative teamwork, with responsibility shared among multidisciplinary, multilingual and multicultural teams.
Type C Code Competences Nuclear
 C1.1 Have an intermediate mastery of a foreign language, preferably English
 C1.2 Be advanced users of the information and communication technologies

Learning outcomes
Type A Code Learning outcomes
 A1.1 A1.1 Have a broad knowledge of the field of science and technology, and are aware of the capacities, limitations and applications of the current techniques used to characterise nanostructures.
 A2.1 A2.1 Correctly interpret the information provided by characterisation techniques.
A2.1 Use SEM/ESEM, TEM, AFM and confocal microscopy from a practical point of view.
 A2.2 A2.2 Can identify which technique or techniques need to be used to solve a particular problem of characterising nanostructures.
A2.2 Make practical use of ESEM/SEM, TEM, AFM and confocal microscopy.
Type B Code Learning outcomes
 B3.1 B3.1 Accept and comply with the rules of the group.
B3.1 Take active part in planning the team’s work, distributing tasks and respecting deadlines.
B3.1 Contribute to the positive management of any differences, disagreements and conflicts that arise in the team.
B3.1 Make their personal contribution in the time expected and with the resources available.
B3.1 Take active part and share information, knowledge and experiences.
B3.1 Take into account the points of view of others and give constructive feedback.
Type C Code Learning outcomes
 C1.1 Express opinions on abstract or cultural topics in a limited fashion.
Explain and justify briefly their opinions and projects.
Understand instructions about classes or tasks assigned by the teaching staff.
Understand routine information and articles.
Understand the general meaning of texts that have non-routine information in a familiar subject area.
Write letters or take notes about foreseeable, familiar matters.
 C1.2 Understand basic computer hardware.
Understand the operating system as a hardware manager and the software as a working tool.
Use software for off-line communication: word processors, spreadsheets and digital presentations.
Use software for on-line communication: interactive tools (web, moodle, blogs, etc.), e-mail, forums, chat rooms, video conferences, collaborative work tools, etc.

Contents
Topic Sub-topic
1. Introduction. Optical microscopy. Confocal microscopy. Aplications and future.
2. Scanning probe microscopy (SPM). Background of the different techniques. Scanning tunnelling microscopy (STM). Basic principles. Determination of the surface by STM. Scanning and tunnelling spectroscopies. Atomic manipulation with STM. Recent advances and applications.
3. Atomic force microscopy (AFM). Basic principles. Dynamic and contact modes. Measuring local properties with AFM. Other SPM techniques. Applications to materials in the nanoscale.
4. Electron microscopy. General aspects. Generation of the beam of electrons. Interaction of electrons with matter. Scanning electron microscopy (SEM). Environmental scanning electron microscopy (ESEM). X-ray analysis in SEM/ESEM. Applications.
5. Transmission electron microscopy (TEM). Sample preparation. Applications.
6. Diffraction techniques for the determination of crystalline structures. X-ray diffraction (XRD).

Planning
Methodologies  ::  Tests
  Competences (*) Class hours
 Hours outside the classroom
 (**) Total hours
Introductory activities
1.5 2.5 4
Lecture
A1.1
A2.1
A2.2
 15 10 25
Laboratory practicals
A1.1
A2.2
B3.1
 10 6 16
Assignments
A1.1
A2.1
A2.2
B3.1
 1 19 20
Presentations / expositions
A1.1
B3.1
C1.1
C1.2
 1.5 6.5 8
Personal tuition
1 0 1
 
Extended-answer tests
A1.1
A2.1
A2.2
C1.1
 1 0 1
 
(*) On e-learning, hours of virtual attendance of the teacher.
(**) The information in the planning table is for guidance only and does not take into account the heterogeneity of the students.

Methodologies
Methodologies
  Description
Introductory activities An introductory session to provide a classification of the characterization techniques and their role in nanoscience and nanotechnology. Previously to the session, student will read a couple of papers about the framework of characterization techniques, and these papers will be discussed in class..
Lecture Sessions covering the basic principles, operation modes, applications and fundamental limitations of characterization techniques.
Laboratory practicals Practical sessions in the facilities of "Servei de Recursos Científics" of Universitat Rovira i Virgili.
Assignments Individual assignments and short presentations in class about a very specific subject that students have to work and present individually.
Presentations / expositions Students will form groups and each group will make an oral presentation about one of the course sessions.
Personal tuition Meetings with students, either individually or in groups, to improve their performance.

Personalized attention
Description
Jordi Riu Office 312, third floor Faculty of Chemistry Phone: 977558491 e-mail: jordi.riu@urv.cat

Assessment
Methodologies Competences Description Weight        
Assignments
A1.1
A2.1
A2.2
B3.1
 Individual assignments 25
Presentations / expositions
A1.1
B3.1
C1.1
C1.2
 Group oral exposition 25
Extended-answer tests
A1.1
A2.1
A2.2
C1.1
 Final individual written exam 25
Others  

Active participation (questions, discussion in class, short presentations) during classes and practical sessions.

 25
 
Other comments and second exam session

A minimum of 35% in each part is required to pass the subject. Assistance to lectures and practical sessions is mandatory.

During the exams, any mobil telephone, tablet or other device that has not been expressly authorized for the exam must be switched off and out of view. Any attempt to pass any exam of any subject by fraudulent means (be this physical or electronic) will result in the student being awarded a fail for the exam in question.

In the second term the student only has to do those parts not passed in the first term. The avaluation criteria are the same than in the first term.

Sources of information

Basic YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Last available edition, Kluver Academic Publishers
KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Last available edition, Wiley

Complementary DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Last available edition, Kluver Academic Publishers
BHUSHAN, B, Handbook of Nanotechnology, Last available edition, Springer
WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science., Last available edition, Plenum Press
BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Last available edition, Wiley
BIRDI, K.S., Scanning probe microscopes: applications in science and technology, Last available edition, CRC Press
GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Last available edition, Kluver Academic, Plenum Press
SAMORI, P., Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Last available edition, Weinheim: Wiley-VCH

Recommendations
(*)The teaching guide is the document in which the URV publishes the information about all its courses. It is a public document and cannot be modified. Only in exceptional cases can it be revised by the competent agent or duly revised so that it is in line with current legislation.