Educational guide School of Chemical Engineering |
english |
Nanoscience and Nanotechnology (2010) |
Subjects |
INTRODUCTION TO CHARACTERIZATION TECHNIQUES |
Sources of information |
IDENTIFYING DATA | 2010_11 |
Subject | INTRODUCTION TO CHARACTERIZATION TECHNIQUES | Code | 20635207 | |||||
Study programme |
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Cycle | 2nd | |||||
Descriptors | Credits | Type | Year | Period | ||||
2.5 | Optional | Only annual |
Competences | Learning aims | Contents |
Planning | Methodologies | Personalized attention |
Assessment | Sources of information | Recommendations |
Basic |
YAO, N., WANG Z.L., Handbook of Microscopy for Nanotechnology, Kluver Academic Publishers, Last availabre edition KELSALL, R., HAMLEY, I., GEOGHEGAN M., Nanoscale Science and Technology, Wiley, Last availabre edition BIRDI, K.S., Scanning probe microscopes: applications in science and technology, CRC Press, Last availabre edition GOLDSTEIN, J.I., Scanning electron microscopy and X-Ray microanalysis, Kluver Academic, Plenum Press, Last availabre edition Paolo Samori, Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures, Weinheim: Wiley-VCH, Last available edition, |
Complementary |
DI VENTRA, M., EVOY S., HEFLIN J.R., Introduction to Nanoscale Science and Nanotechnology, Kluver Academic Publishers, Last availabre edition BHUSHAN, B, Springer Handbook of Nanotechnology, Springer, Last availabre edition WILLIAMS, B., CARTER, C.B., Transmission electron microscopy. A text book for material science. Springer Handbook of Nanotechnology, Plenum Press, Last availabre edition BRIGGS, D., SEAH, M.P., Practical surface analysis: By Auger and X-Ray photoelectron spectroscopy, Wiley, Last availabre edition , Papers about recent trends in characterization techniques for nanostructures, , |
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